Effect of Heat Treatment on Structural and FTIR and Lowercase
Tin oxide (SnO2) is an important oxide semiconductor with wide band gap (Eg=3.6 eV) exhibiting high transparency and high electrical conductivity. These characteristics make it a highly conductivity multifunctional material. Due to this, tin oxide thin films have been widely used in different application areas such us gas sensors, catalysis transparent electrode, Solar cells, spintronics and others. The most important use of SnO2 is for gas sensors. The sensing properties of SnO2 sensors depend on several factors, mainly crystallite size, surface structure and existing bonds. Several methods have been employed for preparing tin oxide thin films including CVD, Sol Gel, spray pyrolysis and others. In this paper we report on the preparation and structural characterization of tin oxide. We report the effect of the heat treatment temperature on cristalinity and FTIR spectra.
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