Dielectric Characterization by Impedance Meter of Thin Films Bi2S3(0.6)ZnS(0.4) Composites
An impedance in module and phase form of thin films Bi2S3(0.6)ZnS(0.4) composites was measured in terms of frequency and temperature using HP4192 impedance meter. Semicircular arcs were obtained. These arcs were theoretically simulated to get the equivalent circuit parameters and to model the different processes taking place in the solid thin films. AC conductivity study expresses the behavior of disordered materials where transport occurs by hopping assisted by phonon between localized states near the Fermi level. The complex permittivity obtained from electrical measurements reflects losses and dissipation of energy in thin films, and it is attributed to the interfacial and dipolar polarization.
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