Chapter 3: Techniques of Synthesis & Characterization of ZnO Nanostructures
To study the electrical and optical properties of ZnO nanostructures, thin films are generally used. The properties of thin films of the material are different from those of the bulk due to the presence of several additional factors such as discontinuities, structural defects, grain growth, and phase changes in thin films. These additional factors in thin films are induced due to various deposition parameters. Noncrystalline thin films of the materials can be prepared by using different methods.
This work is licensed under a Creative Commons Attribution-NonCommercial 4.0 International License.